Custom Polarizer & Phase Plates
Our products can be customized not only for the optical properties, but also for the shape and the spatial distribution of those properties. In particular, they can be made non-uniformly, having a segmented structure or a curved axis along the surface. Customization of the patterned polarizer/waveplate is welcome.
Half-Mirror Polarizer for Laser Cavity
Reflectivity for each polarization can be tuned separately. As a half-mirror in a laser resonance cavity, the element is used to generate and select the output polarization of the laser. Because of its inorganic nature, the element can withstand very high optical power.
True Zero Order Waveplate/Ultra-Violet Polarizers
Photonic crystal waveplates are reliable and perfect zero-order waveplates with small incident angle dependence.For example, a zero-order half-wave plate made of quartz for a wavelength of 266 nm in the ultraviolet region would be about 11 μm thick, but a photonic crystal is deposited on a quartz plate, making it easy to handle.
Ultra-thin waveplate for optical communications
It has insertion loss comparable to that of a quartz plate and can have multiple axial orientations on a single element.Compact and free polarization control can be realized in optical transceivers, optical modulators, receivers, and wavelength selective switches (WSS) in digital coherent systems.
Axial polarization conversion element SWP Series
A waveplate with 12 axial-azimuth regions that can realize axis-oriented polarization simply by inserting it into the optical path. It converts linear polarization into radial (radial) or concentric (azimuthal) polarization. The high transmittance achieves a conversion efficiency of almost 100%. It is effective in optical tweezers, laser processing, etc.
PA series measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Suitable for measurement of glassware and other low phase difference targets.
PA Series PA-micro / PA-micro-S
This equipment measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm. A type that can measure birefringence with microscope FOV. The included microscope can be selected either Olympus or Nikon
High-speed, high-resolution measurement of birefringence/retardation targeting the low measurement range (0～130nm), for example glass, optical lens, etc.Separable light source which can be incorporated into inline and measurement stage.
WPA series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over three waves.
Suitable for measurement of films and transparent resin products.
A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Predict with FOV of microscope. The included microscope can be selected either Olympus or Nikon.
WPA Series WPA-MT
A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.
This product is very effective if evaluation with high spatial resolution is essential.With the WPA series, it is possible to measure a phase difference of about 3000 nm by selecting three different wave lengths and comparing and calculating the phase difference at each wave length.
By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.
KAMAKIRI STS-LS is the only system capable of inspecting the entire surface of films produced continuously for a long period of time. It supports a live display function to check results on the site and an pass/fail judgment function, to enable early detection of defects.
KAMAKIRI MEM-LS can measure and inspect the part of the line you want to see with one camera and the part in the width direction of the film in-line, just like a sampling inspection.As a result, the sampling inspection time is shortened, the production of defective products can be stopped quickly, and the yield can be expected to increase.
KAMAKIRI Birefringence Measurement Module
The KAMAKIRI birefringence measurement module is an effective product in situations where installation on the production line is difficult in terms of space.
KAMAKIRI X-stage is a compact desktop inspection system that is a line scan type. Since the basic algorithm is unified with the inline system, it can be used as an introductory machine before introducing the inline system.
Conventional polarization measurement is a point measurement and the sampling speed is insufficient to measure dynamic changes.
KAMAKIRI MEM-AS is capable of high-speed and area scanning.
X6981 SLS / X6901sc SLS
The FLIR X6981 SLS / X6901sc SLS is an extraordinarily fast, highly sensitive LWIR camera designed for scientists, researchers, and engineers. The strained layer superlattice (SLS) detector offers shorter snapshot speeds, wider temperature bands, and better uniformity than current LWIR or MWIR alternatives.
X6981 / X6901 / X6901sc
The FLIR X6981 / X6901 / X6901sc is an extraordinarily fast, highly sensitive MWIR camera designed for scientists, researchers, and engineers. With advanced triggering, on-camera RAM/SSD recording, and a four-position motorized filter wheel, this camera offers the functionality to stop motion on high speed events, whether they’re in the lab or on the test range.
The FLIR X8501 is a highly sensitive, high-speed, high definition MWIR camera designed for scientists, researchers, and engineers. It has all the features needed for research and science: from on-camera RAM/SSD recording to a four-position motorized flter wheel.
FLIR A8581 MWIR cameras provide the crisp imagery, accurate temperature measurement, and streamlined analysis features needed for industrial, military, and manufacturing R&D applications.
The FLIR A6751 MWIR camera offers short exposure times and high-speed windowed frame rates, making it an ideal choice for recording rapid thermal events and fast-moving targets. Freeze motion or achieve accurate temperature measurements on moving subjects, and perform a variety of non-destructive testing with this cooled InSb camera.
Designed for electronics inspections, manufacturing monitoring, scientific research, and non-destructive testing, the FLIR A6701 MWIR camera is ideal for high-speed thermal events and fast-moving targets. Short exposure times allow users to freeze motion and achieve accurate temperature measurements.
A6261 offers superior sensitivity and dynamic range paired with the flexibility of customized windowing and integration times. This InGaAs camera is very linear in the 0.9 to 1.7 µm sensing waveband, making it the perfect tool for high temperature thermal measurements and applications that require measuring through standard glass.
CRYSTA was researched and developed as the first polarization-sensitive high-speed camera and took more than five years to complete. It enables measurement and visualization of physical quantities and properties in various fields such as biotechnology, military, and aerospace.
Polarization image processing system for polarization object recognition, inspection and OEM. Compact design and direct recording to PC memory.
SDK for embedded development is included as standard.
High-Speed Polarized Interferometer
Unique interference system sustained by our original “CRYSTA Phase Optics”. The product includes software: “CRYSTA phase viewer” for system operation and “CRYSTA Phase Analysis” for advanced analysis of interference fringes. Its high-speed real-time capabilities allow the evaluation of fast-moving dynamic phenomena.
Polarized camera that can acquire all polarization information. You can measure DOP, which indicates the degree of polarization, and distinguish between clockwise and counterclockwise circular polarization. A revolutionary camera that can acquire Stokes parameters that indicate the state of polarization.
PI cameras are capable to obtain polarization information real-time, as a normal image, and at high-resolution.They are used in many areas including recognition of dark objects using their polarization signature, real-time polarization monitoring of laser beams, etc.
This mapping ellipsometer can measure the entire surface of up to φ8" wafers (up to ⌀300mm with option), enabling high-speed, high-resolution surface measurement of film thickness changes of 1nm or less.