2D Birefringence Measurement System
PA Series PA-micro / PA-micro-S
This equipment measures birefringence and phase difference with a high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Predict with FOV of microscope.
The included microscope can be selected from either Olympus or Nikon.
PA-micro-S is only a measurement camera head (Microscope not included).
Please contact us for a compatible microscope.
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| Resolution |
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| Operating wavelength |
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| Dimensions (W x D x H) |
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| Objective lens dimensions |
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| Weight |
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| Interface |
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| Power supply |
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| Software |
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| Accessories |
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| Zoom lens |
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| Data processing function |
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| Field-Of-View (FOV) Correction function |
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| Lens analysis function |
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| Real-time analysis function |
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| Remote control function |
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| Chromatic dispersion mode |
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| WPA High retardation |
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| Lens Measurement Stage |
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| Shading cover for PA/WPA |
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| Photoelasticity measurement |
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| Output |
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| Range |
|
| Repeatability |
|
|
|
| Resolution |
|
| Operating wavelength |
|
|
|
| Dimensions (W x D x H) |
|
| Objective lens dimensions |
|
| Weight |
|
|
|
| Interface |
|
| Power supply |
|
| Software |
|
| Accessories |
|
|
|
| Zoom lens |
|
| Data processing function |
|
| Field-Of-View (FOV) Correction function |
|
| Lens analysis function |
|
| Real-time analysis function |
|
| Remote control function |
|
| Chromatic dispersion mode |
|
| WPA High retardation |
|
| Lens Measurement Stage |
|
| Shading cover for PA/WPA |
|
| Photoelasticity measurement |
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Catalog & Company brochure Download
Category
- #Birefringence & stress strain measurement solutions
- #2-D Birefringence Measurement System
- #Birefringence Measurement System
- #Residual stress