2D Birefringence Measurement System

WPA-micro

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves.

Predict with FOV of microscope.

The included microscope can be selected either Olympus or Nikon.

Evaluation of crystal orientation distribution

Crystal orientation distribution can be datamined in the microscope FOV.
Reflection measurement of opaque samples such as metals is also possible.

Specifications
	measurement
Output	Phase shift / retardation (nm), Axis orientation (°) Stress equivalent (Mpa) ※As part as "data processing" option
Range	0-3500nm （in the case pure quartz was measured)
Repeatability	σ<1.0nm
	Sensor part
Resolution	384 × 288（≒0.11M）pixels
Operating wavelength	523nm,543nm,575nm
	Hardware
Dimensions (W x D x H)	270 × 500 × 615mm
Objective lens dimensions	About 80×110μm~About 2.0×2.7mm Objective lens x2,x5,x10,x20,x50
Weight	About 20kg
	Miscellaneous
Interface	GigE / RS-232C
Power supply	AC100-240V
Software	WPA-View（for WPA-micro）
Accessories	Notebook PC, Standard lens, User manual ※Microscope included in WPA-micro
	Option
Zoom lens	No
Data processing function	Yes
Field-Of-View (FOV) Correction	Yes
Lens analysis function	Yes
Lens Measurement Stage	No
Real-time analysis	Yes
Chromatic dispersion mode	Yes
High retardation measurement option	No
Remote control	Yes

Click here for demonstrations

Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(Japanese)

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related product

PA/WPA-NIR Series

By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.

WPA Series WPA-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

PA-300Series

PA series measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Suitable for measurement of glassware and other low phase difference targets.

PA-300-MT

High-speed, high-resolution measurement of birefringence/retardation targeting the low measurement range (0～130nm), for example glass, optical lens, etc.Separable light source which can be incorporated into inline and measurement stage.

Birefringence & Stress Strain Measurement

We have improved conventional birefringence measurement from point measurement to 2-D surface measurement. High-speed, high-precision birefringence measurement contributes to quality evaluation and functional improvement of optical materials.

PRODUCT DETAILS 2D Birefringence Measurement System

WPA-micro

Evaluation of crystal orientation distribution

Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(Japanese)

Category

related product

PA/WPA-NIR Series

WPA Series WPA-MT

PA-300Series

PA-300-MT

Related solutions

Birefringence & Stress Strain Measurement

Related case studies

Birefringence unevenness inspection of transparent resin molded products

Birefringence unevenness film inspection

Birefringence unevenness inspection in glass plates