2D Birefringence Measurement System

WPA-micro

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves.

Predict with FOV of microscope.

The included microscope can be selected either Olympus or Nikon.

Evaluation of crystal orientation distribution

Crystal orientation distribution can be datamined in the microscope FOV.
Reflection measurement of opaque samples such as metals is also possible.

Specifications
  • measurement
Output
  • Phase shift / retardation (nm), Axis orientation (°)
    Stress equivalent (Mpa) ※As part as "data processing" option
Range
  • 0-3500nm
    (in the case pure quartz was measured)
Repeatability
  • σ<1.0nm
  • Sensor part
Resolution
  • 384 × 288(≒0.11M)pixels
Operating wavelength
  • 523nm,543nm,575nm
  • Hardware
Dimensions
(W x D x H)
  • 270 × 500 × 615mm
Objective lens dimensions
  • About 80×110μm~About 2.0×2.7mm
    Objective lens x2,x5,x10,x20,x50
Weight
  • About 20kg
  • Miscellaneous
Interface
  • GigE / RS-232C
Power supply
  • AC100-240V
Software
  • WPA-View(for WPA-micro)
Accessories
  • Notebook PC, Standard lens, User manual
    ※Microscope included in WPA-micro
  • Option
Zoom lens
  • No
Data processing function
  • Yes
Field-Of-View (FOV) Correction
  • Yes
Lens analysis function
  • Yes
Lens Measurement Stage
  • No
Real-time analysis
  • Yes
Chromatic dispersion mode
  • Yes
High retardation measurement option
  • No
Remote control
  • Yes

Catalog Download

2-D Birefringence Measurement System PA/WPA series(Japanese)

Download

Category

  • #Birefringence & stress strain measurement solutions
  • #2-D Birefringence Measurement System
  • #Birefringence Measurement System
  • #Molded resin products

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