2D Birefringence Measurement System

WPA-KAMAKIRI

This product is very effective if evaluation with high spatial resolution is essential. PET films and resin molded products often have a phase difference of more than 1000 nm, which complicates the optical system for quantitative evaluation of birefringence distribution.

With the WPA series, it is possible to measure a phase difference of about 3000 nm by selecting three different wave lengths and comparing and calculating the phase difference at each wave length. In addition, a high phase difference option is available to meet the needs of measuring ultra-high phase differences of about 10,000 nm.

Measurement Example

Film

Specifications
	Measurement
Output	Phase shift / retardation (nm), Axis orientation (°) Stress equivalent (Mpa) ※As part as "data processing" option
Range	0-3500nm （in the case pure quartz was measured)
Repeatability	σ<1.0nm
	Sensor part
Resolution	852 × 680 (≒0.58M) pixels
Operating wavelength	523nm,543nm,575nm
	Hardware
Dimensions (W x D x H)	430 × 487 × Max.1155mm
Field of View	Approx. 97 × 77mm ～ Approx. 320 × 255mm
Weight	About 23kg
	Miscellaneous
Interface	Dedicated PCI Express interface
Power supply	AC100～240V 50/60Hz, 77W AC adapter
Software	WPA-View
Items included	Desktop PC, Objective Lens, User manual
	Option
Zoom lens	No
Field-Of-View (FOV) Correction	Yes
Lens analysis function	Yes
Lens Measurement Stage	Yes
Real-time analysis	Yes
Chromatic dispersion mode	Yes
High retardation measurement option	Yes
Remote control	Yes

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related product

WPA-200-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

PA-300Series

PA series measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Suitable for measurement of glassware and other low phase difference targets.

WPA-micro

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Predict with FOV of microscope. The included microscope can be selected either Olympus or Nikon.

PA Series PA-micro / PA-micro-S

This equipment measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm. A type that can measure birefringence with microscope FOV. The included microscope can be selected either Olympus or Nikon

Birefringence & Stress Strain Measurement

We have improved conventional birefringence measurement from point measurement to 2-D surface measurement. High-speed, high-precision birefringence measurement contributes to quality evaluation and functional improvement of optical materials.

PRODUCT DETAILS 2D Birefringence Measurement System

WPA-KAMAKIRI

Measurement Example

Category

related product

WPA-200-MT

PA-300Series

WPA-micro

PA Series PA-micro / PA-micro-S

Related solutions

Birefringence & Stress Strain Measurement

Related case studies

Birefringence unevenness film inspection

Birefringence unevenness inspection of transparent resin molded products

Birefringence unevenness inspection in glass plates