Birefringence unevenness inspection in glass plates

Glass and plate inspection

Our birefringence measurement products, like PA series, WPA series, including WPA-KAMAKIRI, are widely used for visualization and quantitative evaluation of residual stress distribution, which can cause cracking or degradation of optical performance such as MTF and transmittance degradation. In recent years, our systems have also been used for 2-D evaluation of the birefringence distribution of high-quality glass for automotive displays.

Glass for Smartphone

Residual stress during glass processing varies depending on the degree of friction applied by the tool when processing. By quantitatively evaluating the residual stress at the processing point, it is possible, for example, to determine the appropriate time to replace the tool before breakage or before its reduced properties have a too bad impact of the quality of the processed parts.

Molded parts for HUD

Variations in optical characteristics of molded products can cause contrast reduction and shape deviation in image display, for example in the case of a cover part used in Head-Up Display (HUD). It is possible to quantitatively determine whether the product is good or bad.

Glass substrate

Distortion of the glass substrate may cause deformation when it is post-processed as a substrate. While checking the distribution of distortion, we perform quality inspections and set up conditions for annealing, cutting, and drilling.

related product

WPA-300Series

The WPA-300 series provides sharper measurement by increasing the resolution of the polarization image sensor up to 5 times, while maintaining the large phase difference measurement performance of the WPA-200 series.

WPA-KAMAKIRI

This product is very effective if evaluation with high spatial resolution is essential.With the WPA series, it is possible to measure a phase difference of about 3000 nm by selecting three different wave lengths and comparing and calculating the phase difference at each wave length.

PA-300-MT

High-speed, high-resolution measurement of birefringence/retardation targeting the low measurement range (0～130nm), for example glass, optical lens, etc.Separable light source which can be incorporated into inline and measurement stage.

PA/WPA-NIR Series

By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.

#Birefringence & stress strain measurement solutions
#2-D Birefringence Measurement System
#Birefringence Measurement System

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