Near Infra-Red (NIR) 2D Birefringence Measurement System

PA/WPA-NIR Series

PA-300-NIR

WPA-200-NIR

PA-300-NIR uses 850 nm in the near-infrared band for the measurement of wave length, the distribution of birefringence/phase difference can be measured at high speed with 5 Megapixels resolution even for materials that are opaque to the naked eye. This equipment is targeted for low phases with a measurement range of 0 to 213 nm.
Suitable for measuring targets that make near-infrared wave lengths transparent like chalcogenide lenses.

WPA-200-NIR uses three wavelengths in the near-infrared band for the measurement wavelengths, and the birefringence of the measurement target transmitting near-infrared wavelengths can be measured.
Suitable for measuring targets that make near-infrared wave lengths transparent like LiDAR automotive components, etc.

Case study measuring chalcogenide lenses

Chalcogenide lenses(Visible light is not transmitted and appears black).

Distortion in the lens could be measured as phase difference.

Case study of measuring a cover for LiDAR laser scanner

Cover for LiDAR laser scanner

Weld lines that occur at the confluence of resin in injection molding were measured.

Real-time view also allows you to check the distribution of strain inside the resin while moving the part.

PA-300-NIR Specifications
	measurement
Output	Phase shift / retardation (nm), Axis orientation (°) Stress equivalent (Mpa) ※As part as "data processing" option
Range	0～213nm
Repeatability	σ<1.0nm
	Sensor part
Resolution	2056 × 2464（≒5M）pixels
Operating wavelength	850nm
	Hardware
Dimensions (W x D x H)	270 × 337 × Max 631mm
Objective lens dimensions	About 30 × 36mm~About 100 × 133mm（standard lens） About 5.5 × 6.6mm~About 25 × 30mm(zoom lens)※option
Weight	About 12kg
	Miscellaneous
Interface	GigE (camera signal)
Power supply	AC100～240V（50/60Hz） / ～6.0A
Software	PA-View
Accessories	Notebook PC, Standard lens, User manual
	Option
Zoom lens	Yes
Data processing function	Yes
Field-Of-View (FOV) Correction function	Yes
Lens analysis function	Yes
Real-time analysis function	Yes
Remote control function	Yes
Chromatic dispersion mode	No
WPA High retardation	No
Lens Measurement Stage	Yes
Shading cover for PA/WPA	Yes
Photoelasticity measurement	No

WPA-200-NIR Specifications
	measurement
Output	Phase shift / retardation (nm), Axis orientation (°) Stress equivalent (Mpa) ※As part as "data processing" option
Range	0-3500nm （in the case pure quartz was measured)
Repeatability	σ<1.0nm
	Sensor part
Resolution	384 × 288（≒0.11M）pixels
Operating wavelength	810nm, 850nm, 880nm
	Hardware
Dimensions (W x D x H)	270 × 337 × Max 631mm
Objective lens dimensions	About 27 × 36mm ～ About 100 × 133mm（standard lens） About 3.0 × 4.0mm ～ About 14.2 × 19.0mm(zoom lens)※option
Weight	About 13kg
	Miscellaneous
Interface	GigE (camera signal)
Power supply	AC100～240V（50/60Hz） / ～5.0A
Software	WPA-View
Accessories	Notebook PC, Standard lens, User manual
	Option
Zoom lens	Yes
Data processing function	Yes
Field-Of-View (FOV) Correction function	Yes
Lens analysis function	Yes
Real-time analysis function	Yes
Remote control function	Yes
Chromatic dispersion mode	Yes
WPA High retardation	No
Lens Measurement Stage	Yes
Shading cover for PA/WPA	Yes
Photoelasticity measurement	No

Click here for demonstrations

Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(English)

Download

related product

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Suitable for measurement of films and transparent resin products.

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Birefringence & Stress Strain Measurement

We have improved conventional birefringence measurement from point measurement to 2-D surface measurement. High-speed, high-precision birefringence measurement contributes to quality evaluation and functional improvement of optical materials.

PRODUCT DETAILS 2D Birefringence Measurement System

PA/WPA-NIR Series

Case study measuring chalcogenide lenses

Case study of measuring a cover for LiDAR laser scanner

Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(English)

Category

related product

PA-300-MT

WPA-200Series

WPA-micro

PA Series PA-micro / PA-micro-S

Related solutions

Birefringence & Stress Strain Measurement

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Tool and Chip Temperature Measurement during Cutting Process

2D measurement of transparent thin films

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