Tool and Chip Temperature Measurement during Cutting Process
Thermal image visualization and temperature measurement are available for temperature changes in friction areas during cutting.
Evaluating rapid temperature changes in the tool or base material and the temperature of flying chips is useful for analyzing precise cutting conditions.
We offer a comprehensive system proposal including optical system and camera selection, for applications ranging from R&D to quality inspections.
X6981 SLS / X6901sc SLS
The FLIR X6981 SLS / X6901sc SLS is an extraordinarily fast, highly sensitive LWIR camera designed for scientists, researchers, and engineers. The strained layer superlattice (SLS) detector offers shorter snapshot speeds, wider temperature bands, and better uniformity than current LWIR or MWIR alternatives.
A6261 offers superior sensitivity and dynamic range paired with the flexibility of customized windowing and integration times. This InGaAs camera is very linear in the 0.9 to 1.7 µm sensing waveband, making it the perfect tool for high temperature thermal measurements and applications that require measuring through standard glass.
The FLIR A6751 MWIR camera offers short exposure times and high-speed windowed frame rates, making it an ideal choice for recording rapid thermal events and fast-moving targets. Freeze motion or achieve accurate temperature measurements on moving subjects, and perform a variety of non-destructive testing with this cooled InSb camera.
Designed for electronics inspections, manufacturing monitoring, scientific research, and non-destructive testing, the FLIR A6701 MWIR camera is ideal for high-speed thermal events and fast-moving targets. Short exposure times allow users to freeze motion and achieve accurate temperature measurements.
- #High-speed heat propagation imaging solutions
- #Infrared high-speed camera
- #High-speed infrared camera