2D Birefringence Measurement System

WPA Series WPA-MT

A series that expands the measurement range of phase difference to 0 ～ 3,500 nm by measuring the distribution of birefringence/phase difference over 3 wavelengths.

Separable light source so the measurement head can be incorporated inline into production line.

Specifications
	measurement
Output	Phase shift / retardation (nm), Axis orientation (°) Stress equivalent (Mpa) ※As part as "data processing" option
Range	0-3500nm (in the case pure quartz was measured)
Repeatability	σ<0.1nm
	Sensor part
Resolution	384 × 288 (≒0.11M) pixels
Operating wavelength	523nm, 543nm, 575nm
	Hardware
Dimensions (W x D x H)	160 × 215 × 300mm with base station
Objective lens dimensions	Approx. 33 × 44mm（standard lens） Approx. 4.1 × 5.5mm ～ Approx. 11.5 × 15.3mm (zoom lens version) ※Lens type (standard or zoom) could not be changed after purchase
Weight	Approx. 4.5kg
	Miscellaneous
Interface	GigE (camera signal)
Power supply	AC100～240V（50/60Hz） / ～5.0A
Software	WPA-View
Accessories	Notebook PC, Standard lens, User manual, Selected lens (standard or zoom)
	Option
Zoom lens	Subject to discussion
Data processing function	Yes
Field-Of-View (FOV) Correction	Yes
Lens analysis function	Yes
Lens Measurement Stage	Yes
Real-time analysis	Yes
Chromatic dispersion mode	Yes
High retardation measurement option	Subject to discussion
Remote control	Supplied by default

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2-D Birefringence Measurement System PA/WPA series(Japanese)

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2-D Birefringence Measurement System PA/WPA series(Japanese)

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related product

PA Series PA-micro / PA-micro-S

This equipment measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm. A type that can measure birefringence with microscope FOV. The included microscope can be selected either Olympus or Nikon

WPA-micro

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Predict with FOV of microscope. The included microscope can be selected either Olympus or Nikon.

WPA Series WPA-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

PA/WPA-NIR Series

By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.

Birefringence & Stress Strain Measurement

We have improved conventional birefringence measurement from point measurement to 2-D surface measurement. High-speed, high-precision birefringence measurement contributes to quality evaluation and functional improvement of optical materials.

PRODUCT DETAILS 2D Birefringence Measurement System

WPA Series WPA-MT

Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(Japanese)

Download

2-D Birefringence Measurement System PA/WPA series(Japanese)

Category

related product

PA Series PA-micro / PA-micro-S

WPA-micro

WPA Series WPA-MT

PA/WPA-NIR Series

Related solutions

Birefringence & Stress Strain Measurement

Related case studies

Birefringence unevenness inspection of transparent resin molded products

Birefringence unevenness inspection in glass plates

Birefringence unevenness film inspection