2D Birefringence Measurement System

PA-300-MT

High-speed, high-resolution measurement of birefringence/retardation targeting the low measurement range (0～130nm), for example glass, optical lens, etc.

Separable light source so the measurement head can be incorporated inline into production line.

Specifications
	measurement
Output	Phase shift / retardation (nm), Axis orientation (°) Stress equivalent (Mpa) ※As part as "data processing" option
Range	0～130nm
Repeatability	σ<0.1nm
	Sensor part
Resolution	2056 × 2464（≒5M）pixels
Operating wavelength	520nm
	Hardware
Dimensions (W x D x H)	160 × 190 × 316mm
Objective lens dimensions	About 37× 44mm（standard lens） About 7.0 × 8.4 mm ～ About 20.0 × 24.0 mm(zoom lens version) ※depens on setting condition
Weight	About 4㎏
	Miscellaneous
Interface	GigE (camera signal)
Power supply	AC100～240V（50/60Hz） / ～6.0A
Software	PA-View
Accessories	Notebook PC, Standard lens, User manual
	Option
Zoom lens	Yes
Data processing function	Yes
Field-Of-View (FOV) Correction	Yes
Lens analysis function	Yes
Lens Measurement Stage	Yes
Real-time analysis	Yes
Chromatic dispersion mode	No
High retardation measurement option	No
Remote control	Supplied by default

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Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(Japanese)

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related product

PA Series PA-micro / PA-micro-S

This equipment measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm. A type that can measure birefringence with microscope FOV. The included microscope can be selected either Olympus or Nikon

PA-300Series

PA series measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Suitable for measurement of glassware and other low phase difference targets.

PA-300-MT

High-speed, high-resolution measurement of birefringence/retardation targeting the low measurement range (0～130nm), for example glass, optical lens, etc.Separable light source which can be incorporated into inline and measurement stage.

WPA Series WPA-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

Birefringence & Stress Strain Measurement

We have improved conventional birefringence measurement from point measurement to 2-D surface measurement. High-speed, high-precision birefringence measurement contributes to quality evaluation and functional improvement of optical materials.

PRODUCT DETAILS 2D Birefringence Measurement System

PA-300-MT

Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(Japanese)

Category

related product

PA Series PA-micro / PA-micro-S

PA-300Series

PA-300-MT

WPA Series WPA-MT

Related solutions

Birefringence & Stress Strain Measurement

Related case studies

Birefringence unevenness film inspection

Birefringence unevenness inspection in glass plates

Birefringence unevenness inspection of transparent resin molded products