2D Birefringence Measurement System

PA-300-MT

High-speed, high-resolution measurement of birefringence/retardation targeting the low measurement range (0~130nm), for example glass, optical lens, etc.

Separable light source so the measurement head can be incorporated inline into production line.

Specifications
  • measurement
Output
  • Phase shift / retardation (nm), Axis orientation (°)
    Stress equivalent (Mpa) ※As part as "data processing" option
Range
  • 0~130nm
Repeatability
  • σ<0.1nm
  • Sensor part
Resolution
  • 2056 × 2464(≒5M)pixels
Operating wavelength
  • 520nm
  • Hardware
Dimensions
(W x D x H)
  • 160 × 190 × 316mm
Objective lens dimensions
  • About 37× 44mm
    ※depens on setting condition
Weight
  • About 4㎏
  • Miscellaneous
Interface
  • GigE (camera signal)
Power supply
  • AC100~240V(50/60Hz) / ~6.0A
Software
  • PA-View
Accessories
  • Notebook PC, Standard lens, User manual
  • Option
Zoom lens
  • Yes
Data processing function
  • Yes
Field-Of-View (FOV) Correction
  • Yes
Lens analysis function
  • Yes
Lens Measurement Stage
  • Yes
Real-time analysis
  • Yes
Chromatic dispersion mode
  • No
High retardation measurement option
  • No
Remote control
  • Supplied by default

Catalog Download

2-D Birefringence Measurement System PA/WPA series(Japanese)

Download

Category

  • #Birefringence & stress strain measurement solutions
  • #2-D Birefringence Measurement System
  • #Birefringence Measurement System
  • #Residual stress

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