In-line/off-line mapping-type birefringence measurement system
Desktop system suitable for sampling inspection and evaluation of developed products
KAMAKIRI X-stage is a compact desktop inspection system that is a line scan type. Since the basic algorithm is unified with the inline system, it can be used as an introductory machine before introducing the inline system.
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|Principal axis orientation measurement range||
|Principal axis orientation repeatability||
|Center wavelength for measurement||
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In-line/off-line mapping-type birefringence measurement system KAMAKIRI
- #Birefringence & stress strain measurement solutions
- #In-line/off-line mapping-type birefringence measurement system
- #High-speed Polarization Camera
KAMAKIRI MEM-LS can measure and inspect the part of the line you want to see with one camera and the part in the width direction of the film in-line, just like a sampling inspection.As a result, the sampling inspection time is shortened, the production of defective products can be stopped quickly, and the yield can be expected to increase.
KAMAKIRI STS-LS is the only system capable of inspecting the entire surface of films produced continuously for a long period of time. It supports a live display function to check results on the site and an pass/fail judgment function, to enable early detection of defects.
KAMAKIRI Birefringence Measurement Module
The KAMAKIRI birefringence measurement module is an effective product in situations where installation on the production line is difficult in terms of space.