In-line/off-line mapping-type birefringence measurement system

KAMAKIRI X-Stage

Desktop system suitable for sampling inspection and evaluation of developed products

KAMAKIRI X-stage is a compact desktop inspection system that is a line scan type. Since the basic algorithm is unified with the inline system, it can be used as an introductory machine before introducing the inline system.

Specifications
Model name	KAMAKIRI X-Stage
Major application	Sampling Inspection Development product evaluation
System Features	1. Minute strain evaluation 2. High correlation with STS 3. Possible to modify to STS
measurement item	Retardation, Principal axis orientation
Retardation measurement range	0~260nm
Retardation repeatability	＜士1nm　 *Performance evaluated under our specified measurement conditions with a reference retardation plate
Principal axis orientation measurement range	0~180°
Principal axis orientation repeatability	＜土1　※Repeatability when the phase difference value is 10 nm or more.
Center wavelength for measurement	543nm　 *Please contact us if you wish to change the center wavelength.
Number of measurement points	424
Software [Japanese/English]	KAMAKIRI in-line basic software
Customization achievement	Large X-stage has been manufactured (1500mm width film can be measured in one scan)

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In-line/off-line mapping-type birefringence measurement system KAMAKIRI

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PRODUCT DETAILS In-line/off-line mapping-type birefringence measurement system

KAMAKIRI X-Stage

Desktop system suitable for sampling inspection and evaluation of developed products

Catalog & Company brochure Download

In-line/off-line mapping-type birefringence measurement system KAMAKIRI

Category

related product

KAMAKIRI Birefringence Measurement Module

KAMAKIRI STS-LS

KAMAKIRI MEM-AS

KAMAKIRI MEM-LS

Related solutions

Birefringence & Stress Strain Measurement

Related case studies

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