In-line/off-line mapping-type birefringence measurement system
Observes dynamic birefringence changes with area scan
Conventional polarization measurement uses a point measurement, and the sampling speed is insufficient to measure dynamic changes.
KAMAKIRI MEM-AS is capable of high-speed area scanning.
In addition, it is possible to evaluate fluctuations in the extrusion flow of the resin, stretching speed, and uneven strength by using time-series data at any point.
Changes in the phase difference and main axis directional distribution can be saved as a moving image (AVI format), which is effective for explaining measurement data.
Phase difference at die exit
Fluctuation of orientation irregularity
Evaluation of birefringence
Evaluation of chuck peripheral behavior during stretching in a stretching machine
|Retardation measurement range||
|Principal axis orientation measurement range||
|Principal axis orientation repeatability||
|Center wavelength for measurement||
|Number of measurement points||
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- #Full-length, full-width film quality control solutions
- #In-line/off-line mapping-type birefringence measurement system
- #Birefringence Measurement System
KAMAKIRI STS-LS is the only system capable of inspecting the entire surface of films produced continuously for a long period of time. It supports a live display function to check results on the site and an pass/fail judgment function, to enable early detection of defects.
KAMAKIRI MEM-LS can measure and inspect the part of the line you want to see with one camera and the part in the width direction of the film in-line, just like a sampling inspection.As a result, the sampling inspection time is shortened, the production of defective products can be stopped quickly, and the yield can be expected to increase.
KAMAKIRI X-stage is a compact desktop inspection system that is a line scan type. Since the basic algorithm is unified with the inline system, it can be used as an introductory machine before introducing the inline system.