Basic Structure of the Systems & Measurement Examples(3/4)

Basic Structure 


③Birefringence (phase shift & axis orientation) at each point by comparison of the states of polarization

Why using circular polarizer film:
If we used a linear polarizer, the regions of the sample having the same axis orientation as the film would not be correctly evaluated (no sensitivity).
Circular polarizer film allows to obtain the same sensitivity to birefringence independently from axis orientation.


Actual system picture

PA System : Measurement Example (1)


Plastic Molded Lens:
Distribution of Axis Orientation


Optical quality glass : phase shift distribution

PA System : Measurement Example (2)

PA Series include a model for microscopic applications, enabling evaluation of very small samples.


Measurement of birefringence distribution in an optical fiber cross-section 
Graph along straight line

PA System : Measurement Example (3)

Plastic molded part (test piece) : evaluation of the differences between materials


Differences of material & molding parameters appear clearly as differences in the birefringence profile.


Phase shift along transversal line

※PC actually has the highest distortion. However, the phase difference is too large for the PA series to be measured correctly.

 

Range limitations of PA Series systems

The maximum birefringence that can be measured by PA system is λ/4.
Samples exhibiting greater retardation will be displayed with wrapped around values.

Evolution of recorded retardation for growing applied force on test piece (photo-elastic)

Values over ¼ of operating wavelength (520nm) are wrapped around.
It can result in ripples that do not exist in reality.

PA Series is limited to the evaluation of samples of less than 100nm of birefringence.

 

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WPA-micro

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Predict with FOV of microscope. The included microscope can be selected either Olympus or Nikon.

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WPA-200-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

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PA/WPA-NIR Series

By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.

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CRYSTA PI-5WP

Polarization image processing system for polarization object recognition, inspection and OEM. Compact design and direct recording to PC memory.
SDK for embedded development is included as standard.

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