Measurement principle of Birefringence Measurement System PA/WPA series.(2/4)

Basic structure of Polarization Imaging Sensor

Microscopic size polarization filters are integrated and placed in front of a CCD image sensor

Please also see this page. About Special Image Sensor Manufacturing Technology

 

Principle of Polarization Imaging Sensor Technology and Measurement

Computation of polarization information from intensity at 4 neighbor pixels

[Relation between input polarization and intensity pattern]


[Computation principle ]
Intensity is supposed to describe a sinusoid.
By knowing only 4 points of the curve, it is possible to recover the whole set of information for any input polarization.

Polarizer angle

Intensity pattern is linked to the state of polarization at each location


Birefringence data (phase shift and axis orientation) is present at each point as quantitative data.

Measurement example: lens


Phase shift distribution


Axis orientation

・Detailed quantitative evaluation and comparison is possible between multiple sets of data.
・The slightest differences between two sets of data are easy to spot on displayed images.


Phase along lens circumference

 

 

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PA/WPA-NIR Series

By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.

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PA-300-MT

High-speed, high-resolution measurement of birefringence/retardation targeting the low measurement range (0~130nm), for example glass, optical lens, etc.Separable light source which can be incorporated into inline and measurement stage.

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WPA-200Series

WPA series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over three waves.
Suitable for measurement of films and transparent resin products.

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PA Series PA-micro / PA-micro-S

This equipment measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm. A type that can measure birefringence with microscope FOV. The included microscope can be selected either Olympus or Nikon

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