Basic Structure of the Systems & Measurement Examples(3/4)

Basic Structure 


③Birefringence (phase shift & axis orientation) at each point by comparison of the states of polarization

Why using circular polarizer film:
If we used a linear polarizer, the regions of the sample having the same axis orientation as the film would not be correctly evaluated (no sensitivity).
Circular polarizer film allows to obtain the same sensitivity to birefringence independently from axis orientation.


Actual system picture

PA System : Measurement Example (1)


Plastic Molded Lens:
Distribution of Axis Orientation


Optical quality glass : phase shift distribution

PA System : Measurement Example (2)

PA Series include a model for microscopic applications, enabling evaluation of very small samples.


Measurement of birefringence distribution in an optical fiber cross-section 
Graph along straight line

PA System : Measurement Example (3)

Plastic molded part (test piece) : evaluation of the differences between materials


Differences of material & molding parameters appear clearly as differences in the birefringence profile.


Phase shift along transversal line

※PC actually has the highest distortion. However, the phase difference is too large for the PA series to be measured correctly.

 

Range limitations of PA Series systems

The maximum birefringence that can be measured by PA system is λ/4.
Samples exhibiting greater retardation will be displayed with wrapped around values.

Evolution of recorded retardation for growing applied force on test piece (photo-elastic)

Values over ¼ of operating wavelength (520nm) are wrapped around.
It can result in ripples that do not exist in reality.

PA Series is limited to the evaluation of samples of less than 100nm of birefringence.

 

Related tags

related product

PA-300Series

PA series measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Suitable for measurement of glassware and other low phase difference targets.

MORE

CRYSTA Nova S16

This product combines Photron's "FASTCAM Nova" series, which boasts a long history of success in the high-speed camera industry, with Photonic Lattice's proprietary polarization sensor. It is ideal for cutting-edge research and development and measurement fields that require high-speed, high-precision data collection.

MORE

PA Series PA-micro / PA-micro-S

This equipment measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm. A type that can measure birefringence with microscope FOV. The included microscope can be selected either Olympus or Nikon

MORE

WPA-300Series

The WPA-300 series provides sharper measurement by increasing the resolution of the polarization image sensor up to 5 times, while maintaining the large phase difference measurement performance of the WPA-200 series.

MORE

Related case studies

Catalog Download
Quote & Demo Request
Contact Us
Software Download