Introducing an equipment that high-speed measurement distortion of lenses, resin molded products, etc. & exhibition information.(Japanese page only)

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WPA-200-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

WPA-KAMAKIRI

This product is very effective if evaluation with high spatial resolution is essential.With the WPA series, it is possible to measure a phase difference of about 3000 nm by selecting three different wave lengths and comparing and calculating the phase difference at each wave length.

PA-300-MT

High-speed, high-resolution measurement of birefringence/retardation targeting the low measurement range (0～130nm), for example glass, optical lens, etc.Separable light source which can be incorporated into inline and measurement stage.

WPA-micro

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Predict with FOV of microscope. The included microscope can be selected either Olympus or Nikon.

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Introducing an equipment that high-speed measurement distortion of lenses, resin molded products, etc. & exhibition information.(Japanese page only)

Related tags

related product

WPA-200-MT

WPA-KAMAKIRI

PA-300-MT

WPA-micro

Related case studies

Enabling Performance Evaluation of VR Lenses : Measurement Examples of the Dedicated Device VRG-100

Birefringence unevenness film inspection

Birefringence unevenness inspection of transparent resin molded products

Birefringence unevenness inspection in glass plates