In-line/off-line mapping-type birefringence measurement system
KAMAKIRI MEM-AS
Observes dynamic birefringence changes with area scan
Conventional polarization measurement uses a point measurement, and the sampling speed is insufficient to measure dynamic changes.
KAMAKIRI MEM-AS is capable of high-speed area scanning.
In addition, it is possible to evaluate fluctuations in the extrusion flow of the resin, stretching speed, and uneven strength by using time-series data at any point.
Changes in the phase difference and main axis directional distribution can be saved as a moving image (AVI format), which is effective for explaining measurement data.
Applications
Phase difference at die exit
Fluctuation of orientation irregularity
Evaluation of birefringence
Evaluation of chuck peripheral behavior during stretching in a stretching machine
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| Major application |
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| System Features |
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| Measurement item |
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| Retardation measurement range |
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| Retardation repeatability |
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| Principal axis orientation measurement range |
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| Principal axis orientation repeatability |
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| Center wavelength for measurement |
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| Number of measurement points |
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| Software [Japanese/English] |
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| Customization achievement |
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