About Special Image Sensor Manufacturing Technology

There are an increasing number of applications that are different from those of conventional image sensors. Examples include obstacle detection in the automatic driving function of EVs and spectroscopic inspection in cellular testing. We possess the manufacturing technology to connect micro-scale optical elements to image sensor pixels to realize high-value-added image sensors. For example, we can provide special image sensors to the market after understanding the optical performance of micro optical element arrays, considering the best connection conditions that can maintain the performance as much as possible, making prototypes, and establishing our own mass production process.

Electron micrograph of a micro-polarizer for polarization image sensor

Photograph of a polarized high-speed image sensor

An example using this technology is a polarization high-speed image sensor. By connecting a micro-scale linear polarization element with different axis directions and a high-speed CMOS image sensor with a parallel readout circuit, we have developed a special image sensor that can capture polarization phenomena at high speed and in two dimensions. This sensor has been utilized to visualization and control of phenomena that are difficult with conventional CMOS image sensors, such as optimization of cutting conditions by analyzing stress distribution during cutting, or improvement of the acoustic effect of ultrasonic sonar by visualizing sound transmitted through space.

Thus, we always have interests in improving the optical performance of image sensors, and are constantly conducting technological researches.

related product

WPA-300Series

The WPA-300 series provides sharper measurement by increasing the resolution of the polarization image sensor up to 5 times, while maintaining the large phase difference measurement performance of the WPA-200 series.

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PA/WPA-NIR Series

By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.

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CRYSTA PI-5WP

Polarization image processing system for polarization object recognition, inspection and OEM. Compact design and direct recording to PC memory.
SDK for embedded development is included as standard.

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WPA-KAMAKIRI

This product is very effective if evaluation with high spatial resolution is essential.With the WPA series, it is possible to measure a phase difference of about 3000 nm by selecting three different wave lengths and comparing and calculating the phase difference at each wave length.

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Related solutions

Full-length, full-width film quality control

With the industry's first full-surface measurement technology for birefringence distribution in optical films, we contribute to the improvement of film quality that leads to the assurance of image quality across the entire display screen.

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Birefringence & Stress Strain Measurement

We have improved conventional birefringence measurement from point measurement to 2-D surface measurement. High-speed, high-precision birefringence measurement contributes to quality evaluation and functional improvement of optical materials.

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