Japanese page only Category #Full-length, full-width film quality control solutions #In-line/off-line mapping-type birefringence measurement system related product KAMAKIRI MEM-LS KAMAKIRI MEM-LS can measure and inspect the part of the line you want to see with one camera and the part in the width direction of the film in-line, just like a sampling inspection.As a result, the sampling inspection time is shortened, the production of defective products can be stopped quickly, and the yield can be expected to increase. MORE KAMAKIRI Birefringence Measurement Module The KAMAKIRI birefringence measurement module is an effective product in situations where installation on the production line is difficult in terms of space. MORE KAMAKIRI MEM-AS Conventional polarization measurement is a point measurement and the sampling speed is insufficient to measure dynamic changes. KAMAKIRI MEM-AS is capable of high-speed and area scanning. MORE KAMAKIRI X-Stage KAMAKIRI X-stage is a compact desktop inspection system that is a line scan type. Since the basic algorithm is unified with the inline system, it can be used as an introductory machine before introducing the inline system. MORE