Notice Regarding Microscope Lenses(Japanese only)

related product

WPA-200-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

PA Series PA-micro / PA-micro-S

This equipment measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm. A type that can measure birefringence with microscope FOV. The included microscope can be selected either Olympus or Nikon

WPA-200Series

WPA series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over three waves.
Suitable for measurement of films and transparent resin products.

PA/WPA-NIR Series

By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.

KNOWLEDGE BASE Knowledge base

Notice Regarding Microscope Lenses(Japanese only)

Category

related product

WPA-200-MT

PA Series PA-micro / PA-micro-S

WPA-200Series

PA/WPA-NIR Series

Related case studies

Enabling Performance Evaluation of VR Lenses : Measurement Examples of the Dedicated Device VRG-100

Birefringence unevenness film inspection

Birefringence unevenness inspection of transparent resin molded products

Birefringence unevenness inspection in glass plates