Notice Regarding Microscope Lenses(Japanese only)

related product

WPA-200-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

PA-300Series

PA series measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Suitable for measurement of glassware and other low phase difference targets.

WPA-KAMAKIRI

This product is very effective if evaluation with high spatial resolution is essential.With the WPA series, it is possible to measure a phase difference of about 3000 nm by selecting three different wave lengths and comparing and calculating the phase difference at each wave length.

PA Series PA-micro / PA-micro-S

This equipment measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm. A type that can measure birefringence with microscope FOV. The included microscope can be selected either Olympus or Nikon

KNOWLEDGE BASE Knowledge base

Notice Regarding Microscope Lenses(Japanese only)

Category

related product

WPA-200-MT

PA-300Series

WPA-KAMAKIRI

PA Series PA-micro / PA-micro-S

Related case studies

Birefringence unevenness film inspection

Birefringence unevenness inspection of transparent resin molded products

Enabling Performance Evaluation of VR Lenses : Measurement Examples of the Dedicated Device VRG-100

Birefringence unevenness inspection in glass plates