2D Birefringence Measurement System

PA Series PA-micro / PA-micro-S

This equipment measures birefringence and phase difference with a high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Predict with FOV of microscope.
The included microscope can be selected from either Olympus or Nikon.

PA-micro-S is only a measurement camera head (Microscope not included).
Please contact us for a compatible microscope.

PA-micro Specifications
	measurement
Output	Phase shift / retardation (nm), Axis orientation (°) Stress equivalent (Mpa) ※As part as "data processing" option
Range	0～130nm
Repeatability	σ<1.0nm
	Sensor part
Resolution	2056 × 2464（≒5M）pixels
Operating wavelength	520nm
	Hardware
Dimensions (W x D x H)	270 × 500 × 610mm
Objective lens dimensions	About 140 × 170μm~About 3.5 × 4.2mm Objective lens　x2,x5,x10,x20,x50
Weight	Approx. About 18kg
	Miscellaneous
Interface	GigE (camera signal)
Power supply	AC100～240V（50/60Hz） / ～6.0A
Software	PA-View
Accessories	Desktop PC, User manual ※Microscope included in PA-micro
	Option
Zoom lens	No
Data processing function	Yes
Field-Of-View (FOV) Correction function	Subject to discussion
Lens analysis function	Yes
Real-time analysis function	Yes
Remote control function	Yes
Chromatic dispersion mode	No
WPA High retardation	No
Lens Measurement Stage	No
Shading cover for PA/WPA	Yes
Photoelasticity measurement	No

PA-micro-S Specifications
	measurement
Output	Phase shift / retardation (nm), Axis orientation (°) Stress equivalent (Mpa) ※As part as "data processing" option
Range	no guarantee
Repeatability	no guarantee
	Sensor part
Resolution	2056 × 2464（≒5M）pixels
Operating wavelength	520nm
	Hardware
Dimensions (W x D x H)	60 × 70 × 85mm
Objective lens dimensions	Depens on microscope
Weight	Approx. About 0.5kg
	Miscellaneous
Interface	GigE (camera signal)
Power supply	AC100～240V（50/60Hz） / ～6.0A
Software	PA-View
Accessories	Desktop PC, User manual
	Option
Zoom lens	No
Data processing function	Yes
Field-Of-View (FOV) Correction function	Subject to discussion
Lens analysis function	Yes
Real-time analysis function	Yes
Remote control function	Yes
Chromatic dispersion mode	No
WPA High retardation	No
Lens Measurement Stage	No
Shading cover for PA/WPA	Yes
Photoelasticity measurement	No

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Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(English)

Download

related product

PA/WPA-NIR Series

By using the near-infrared band for the measurement wavelength, this system can measure birefringence/phase difference distribution even for materials that are opaque to the naked eye. Suitable for measurement targets that transmit near-infrared wavelengths, like chalcogenide lenses, LiDAR automotive components, etc.

PA-300Series

PA series measures birefringence and phase difference with high resolution of 5 million pixels at high speed, for low phase difference with a measurement range of 0 to 130 nm.
Suitable for measurement of glassware and other low phase difference targets.

WPA-300Series

The WPA-300 series provides sharper measurement by increasing the resolution of the polarization image sensor up to 5 times, while maintaining the large phase difference measurement performance of the WPA-200 series.

WPA-200-MT

A series that expands the measurement range of phase difference from 0 to 3,500 nm by measuring the distribution of birefringence/phase difference over 3 waves. Separable light source which can be incorporated into inline and measurement stage.

Birefringence & Stress Strain Measurement

We have improved conventional birefringence measurement from point measurement to 2-D surface measurement. High-speed, high-precision birefringence measurement contributes to quality evaluation and functional improvement of optical materials.

PRODUCT DETAILS 2D Birefringence Measurement System

PA Series PA-micro / PA-micro-S

Catalog & Company brochure Download

2-D Birefringence Measurement System PA/WPA series(English)

Category

related product

PA/WPA-NIR Series

PA-300Series

WPA-300Series

WPA-200-MT

Related solutions

Birefringence & Stress Strain Measurement

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