In-line/off-line mapping-type birefringence measurement system

KAMAKIRI X-Stage

Desktop system suitable for sampling inspection and evaluation of developed products

KAMAKIRI X-stage is a compact desktop inspection system that is a line scan type. Since the basic algorithm is unified with the inline system, it can be used as an introductory machine before introducing the inline system.

Specifications
Model name	KAMAKIRI X-Stage
Major application	Sampling Inspection Development product evaluation
System Features	1. Minute strain evaluation 2. High correlation with STS 3. Possible to modify to STS
measurement item	Retardation, Principal axis orientation
Retardation measurement range	0~260nm
Retardation repeatability	＜士1nm　 *Performance evaluated under our specified measurement conditions with a reference retardation plate
Principal axis orientation measurement range	0~180°
Principal axis orientation repeatability	＜土1　※Repeatability when the phase difference value is 10 nm or more.
Center wavelength for measurement	543nm　 *Please contact us if you wish to change the center wavelength.
Number of measurement points	424
Software [Japanese/English]	KAMAKIRI in-line basic software
Customization achievement	Large X-stage has been manufactured (1500mm width film can be measured in one scan)

Click here for demonstrations

Catalog & Company brochure Download

In-line/off-line mapping-type birefringence measurement system KAMAKIRI

Download

related product

KAMAKIRI MEM-AS

Conventional polarization measurement is a point measurement and the sampling speed is insufficient to measure dynamic changes.
KAMAKIRI MEM-AS is capable of high-speed and area scanning.

KAMAKIRI Birefringence Measurement Module

The KAMAKIRI birefringence measurement module is an effective product in situations where installation on the production line is difficult in terms of space.

KAMAKIRI STS-LS

KAMAKIRI STS-LS is the only system capable of inspecting the entire surface of films produced continuously for a long period of time. It supports a live display function to check results on the site and an pass/fail judgment function, to enable early detection of defects.

KAMAKIRI X-Stage

Birefringence & Stress Strain Measurement

We have improved conventional birefringence measurement from point measurement to 2-D surface measurement. High-speed, high-precision birefringence measurement contributes to quality evaluation and functional improvement of optical materials.

PRODUCT DETAILS In-line/off-line mapping-type birefringence measurement system

KAMAKIRI X-Stage

Desktop system suitable for sampling inspection and evaluation of developed products

Catalog & Company brochure Download

In-line/off-line mapping-type birefringence measurement system KAMAKIRI

Category

related product

KAMAKIRI MEM-AS

KAMAKIRI Birefringence Measurement Module

KAMAKIRI STS-LS

KAMAKIRI X-Stage

Related solutions

Birefringence & Stress Strain Measurement

Related case studies

Evaluating the crack propagation process of glass

Analysis of cutting phenomenon by visualization of internal stress of cutting material

Observation of internal structural changes in fluids

Evaluate the orientation process of the entire coated film