In-line/off-line mapping-type birefringence measurement system
KAMAKIRI X-Stage
Desktop system suitable for sampling inspection and evaluation of developed products
KAMAKIRI X-stage is a compact desktop inspection system that is a line scan type. Since the basic algorithm is unified with the inline system, it can be used as an introductory machine before introducing the inline system.
| Model name |
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| Major application |
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| System Features |
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| measurement item |
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| Retardation measurement range |
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| Retardation repeatability |
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| Principal axis orientation measurement range |
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| Principal axis orientation repeatability |
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| Center wavelength for measurement |
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| Number of measurement points |
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| Software [Japanese/English] |
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| Customization achievement |
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