2D measurement of transparent thin films

By selecting a wavelength at which a material absorbs light and performing observations at that wavelength, it is possible to evaluate 2-D unevenness in the thickness of thin films, such adhesive or coating films.

Unevenness of adhesive coating
Unevenness of release agent application
Unevenness of paint/coating film application

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A6261-PH

A6261-PH offers superior sensitivity and dynamic range paired with the flexibility of customized windowing and integration times. This InGaAs camera is very linear in the 0.9 to 1.7 µm sensing waveband, making it the perfect tool for high temperature thermal measurements and applications that require measuring through standard glass.

X6981 HS SLS-PH

The FLIR X6981 HS SLS-PH is an extraordinarily fast, highly sensitive LWIR camera designed for scientists, researchers, and engineers. The strained layer superlattice (SLS) detector offers shorter snapshot speeds, wider temperature bands, and better uniformity than current LWIR or MWIR alternatives.

X6981 HS-PH

The FLIR X6981 HS-PH is an extraordinarily fast, highly sensitive MWIR camera designed for scientists, researchers, and engineers. With advanced triggering, on-camera RAM/SSD recording, and a four-position motorized filter wheel, this camera offers the functionality to stop motion on high speed events, whether they’re in the lab or on the test range.

A6701-PH

Designed for electronics inspections, manufacturing monitoring, scientific research, and non-destructive testing, the FLIR A6701-PH MWIR camera is ideal for high-speed thermal events and fast-moving targets. Short exposure times allow users to freeze motion and achieve accurate temperature measurements.

USE CASES Use cases

2D measurement of transparent thin films

related product

A6261-PH

X6981 HS SLS-PH

X6981 HS-PH

A6701-PH

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