2022.09.20 High-speed, high-sensitivity measurement of thickness unevenness of organic thin films for semiconductors. 2022.06.29 Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements T. Sato, T. Araki, et al./ APPLIED OPTICS, Vol. 46, No. 22, at Aug 1 2007. 2022.06.24 Optical simulation 2022.06.24 Photonic Crystals