Spectroscopic Polarimeter Sci-Ral｜　Photonic Lattice, Inc. - Photonic Lattice, Inc.　｜　Manufacture and sale of photonic crystals and applied products.

Spectroscopic Polarimeter Sci-Ral

Multifunctional polarization measuring system for spectroscopic measurement of light polarization state, birefringence (R0, Rth), and Mueller matrix

The spectroscopic polarimeter “Sci-Ral” can measure spectroscopic (multi-wavelength) polarization characteristics of optical materials, including the polarization state of light and birefringence, over a wide wavelength range (400 to 800nm) and with a wavelength resolution of 2nm.
In addition, the function can be expanded to measure birefringence (retardation and early (late) axes) of retardation films used in displays, and to measure Mueller matrices that can evaluate polarization characteristics other than birefringence (dichroism, optical rotation, depolarization).

Specifications
Common Specification
Measurement items	Stokes vector (S0-S3) Ellipticity, polarization axis orientation, degree of polarization
Measurement range wavelength	400-800nm Other wavelengths are negotiable
Wavelength resolution	<2nm
Number of wavelength data	Approx. 1500 wavelengths
Measurement time	Approx. 6~30 seconds
Measurement accuracy	<2% @wavelength 532nm
Repeated measurement accuracy	0.01 (Stokes vector) @wavelength 532nm
Birefringence measurement option
Measurement items	Retardation, principal axis direction (fast axis or slow axis)
Measurement time	Approx. 20~60 seconds
Retardation measurement range	0-λ/2nm Analysis function up to 100,000nm
Retardation measurement accuracy	λ/360 @wavelength 532nm
Mueller matrix option
Measurement items	Mueller matrix Linear dichroism, Circular dichroism Linear birefringence, Optical birefringence Depolarization
Measurement items	Approx. 50~120 seconds