Multifunctional polarization measuring system for spectroscopic measurement of light polarization state, birefringence (R0, Rth), and Mueller matrix

The spectroscopic polarimeter “Sci-Ral” can measure spectroscopic (multi-wavelength) polarization characteristics of optical materials, including the polarization state of light and birefringence, over a wide wavelength range (400 to 800nm) and with a wavelength resolution of 2nm.
In addition, the function can be expanded to measure birefringence (retardation and early (late)  axes) of retardation films used in displays, and to measure Mueller matrices that can evaluate polarization characteristics other than birefringence (dichroism, optical rotation, depolarization).