We have started to sell new 5 products.
—–wide-range 2D birefringence measurement system corresponding to high range phase difference
This system can measure phase difference distribution over 10,000 nm.
—–2D birefringence measurement system with a XY stage
This system can measure a 8 inch wafer at once.
—–high-speed mapping ellipsometer corresponding to transparent substrates
This system can measure a thin film on a transparent substrate such as glasses
—–compact-size and reasonable ellispometer
This compact-size ellipsometer has minimum functions and is reasonable.
—–microscope attachment birefringence observation camera