We participated to the FilmTech exposition at Tokyo Big Sight from 4/10 to 4/12. Apart from the presentation of our birefringence measurement and ellipsometric thin-film measurement systems, we presented with our partner Photron two brand new systems, combining our polarization measurement technology with their high-speed camera technology. The first system is a high-speed inline phase-shift measurement system for control quality of optical film, directly inside the process, for a full-length control impossible with current point-measurement systems. An other system provide high-speed birefringence measurement for stretch testing of transparent samples. We hope for a quick spread of high-speed polarization measurement, for even better quality control of optical products.