製品 | 2021/5/14

3. Basic Structure of the Systems & Measurement Examples

①Acquisition of state of polarization over light source   ②Acquisition of state of polarization with sample

③Birefringence (phase shift & axis orientation) at each point by comparison of the states of polarization

Actual system picture

Why using circular polarizer film:
If we used a linear polarizer, the regions of the sample having the same axis orientation as the film would not be correctly evaluated (no sensitivity).
Circular polarizer film allows to obtain the same sensitivity to birefringence independently from axis orientation.

PA System : Measurement Example (1)

レンズの複屈折分布評価
Plastic Molded Lens:
Distribution of Axis Orientation
光学ガラスの複屈折分布評価
Optical quality glass : phase shift distribution

PA System : Measurement Example (2)

PA Series include a model for microscopic applications, enabling evaluation of very small samples.

光ファイバー断面の複屈折分布評価
Cross-section of optical fiber: birefringence evaluation
定量解析が任意線上、領域で可能
Graph along straight line

PA System : Measurement Example (3)

Plastic molded part (test piece) : evaluation of the differences between materials

Phase shift along transversal line

Differences of material & molding parameters appear clearly as differences in the birefringence profile.

Range limitations of PA Series systems

The maximum birefringence that can be measured by PA system is λ/4.
Samples exhibiting greater retardation will be displayed with wrapped around values.

Evolution of recorded retardation for growing applied force on test piece (photo-elastic)

Values over ¼ of operating wavelength (520nm) are wrapped around.
It can result in ripples that do not exist in reality.

PA Series is limited to the evaluation of samples of less than 100nm of birefringence.

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