SEMICON Japan 2013 at Tokyo Big Sight

We participated to SEMICON Japan 2013 (from 12/4/2013 to 12/6/2013) at Makuhari messe, and showed Mapping ellipsometer corresponding to transparent substrate ME-210-T and 2D birefringence measurement system corresponding to large-area sample PA-110-t in a booth of Ryokosha.

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