ME-210-T was published in the Nippon Keizai Shimbun

Mapping ellipsometer ME-210-T, which can measure a transparent substrate, was published in the Nippon Keizai Shimbun at Dec 3, 2013.
A part of this is published also in the electronic version of Nippon Keizai Shimbun.
参考:ME-210-T press release

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