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Exhibitions & Conferences

Dec 2-4, 2009 Maping Ellipsometer ME-110 was exhibited at SEMICON Japan 2009, Makuhari-Messe, Japan
Jun 10-12, 2009 New products was exhibited at Imaging sensing Show Japan 2008
Apr 22-24, 2009 2D Birefringence Analyzer PA100 and New Photonic-crystal elements was exibited at Lens Expo 2009, Pacifico Yokohama, Japan