Ellipsometer

Overview

The Ellipsometer simultaneously measures the thickness and refractive index of optical thin films. The number of fields in which the ellipsometers is is in use is expanding because of the growing significance of the measurement of thin films which cannot be measured by other means.

Conventional ellipsometers are typically large.
This is inevitable, because of the necessity to rotate polarizers, wave-plates and other elements.

The Photonic Crystal Array (PCA) Ellipsometer.
Combining the photonic crystal array and the CCD, the requirement to mechanically rotate elements of the instrument has been completely dispensed with.
The PCA Ellipsometer redefines the concept of the Ellipsometer.